YED900 - Com Express Test Adapter



  • Directly applicable to existing test system
  • Reliable Probe Pin Technology
  • Compatible to ComExpress standards
  • Flexible in module size
  • In-line volume test
  • Volume test ready
  • Other Computer to Module Test Systems on request
Pin Count:220 /440 pins
Current Rating:up to 1 Amp/pin at room temperature
Operating Temp. :-30°C to +85°C
Pitch: 0.5mm
Mating Cycles:50,000 (expected)
Housing: Peek / Anodized Aluminium
Contacts:Beryllium Copper / Gold Plated over Nickel
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Contact

 


For inquiries please contact:
Bernhard Stolz
Product Manager

Phone
+49 89 45109-304 bernhard.stolz@yamaichi.de



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