Test Contactors

Test Contactors for BGA/CSP/QFN/LGA/QFP/SO
Series: YED274- Customised Test Contactor | Pitch sizes ≥ 0.30mm
- Outstanding performance
- Higher temperature range available

Kelvin Test Contactor for QFN/SOP/QFP
Series: YED274- Kelvin spring probe contacts
- Fine-pitch capability | Pitch sizes ≥ 0.30mm
- For use in the lab and on the test floor

Test Contactor for BGA/CSP/QFN/LGA/QFP
Series: YED254- Customised Test Contactor | Pitch sizes ≥ 0.30mm
- Easy to close cover
- Higher temperature range available

HF Socket Y-Shaped CMT Contacts
Series: IC299- The IC299 Test Contactor Series is ideal for automated and manual testing of SOP, SSOP, TSOP and QFP packages in any conceivable pitch size.
Contact
YAMAICHI ELECTRONICS
Deutschland GmbH
Concor Park
Bahnhofstraße 20
85609 Aschheim-Dornach
Phone +49 89 45109-0
Fax +49 89 45109-110> E-mail> Contact form