Probe pin and socket data sheet show usually the contact resistance in ideal conditions. With a design of experiment (DOE), the behavior and change of contact resistance in test sockets over 1,000 hours in HTOL environment has been analyzed. Data show what happens during ramp up, hold and ramp down temperature and give an explanation about a resistance jump after re-insertion of the DUT after read-outs.
Learn all about the experimental design in this tech webinar hosted by SemIsrael. Afterwards you will have the opportunity to ask questions.
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